Effect of Annealing on Structural Properties of Electrodeposited CZTS Thin Films

Abstract

Cu2ZnSnS4 (CZTS) thin films were electrodeposited on Mo substrates at room temperature by a single-step electrodeposition method. The X-ray diffraction showed that, the as-prepared samples were rich in secondary phases. However, the Raman spectra showed the existence of crystalline CZTS phase. The post-annealing treatment was carried out in the temperature range 400 °C–600 °C in an Ar-atmosphere to improve the CZTS phase composition and crystallinity. The kesterite CZTS phase grew to larger extent upon annealing at 500 °C.