JOURNAL ARTICLE

Control Chart Pattern Recognition Using Wavelet Based Neural Networks

Jun Seok KimCheong-Sool ParkJun‐Geol BaekSung-Shick Kim

Year: 2012 Journal:   Zenodo (CERN European Organization for Nuclear Research) Vol: 6 (12)Pages: 1717-1721   Publisher: European Organization for Nuclear Research

Abstract

Control chart pattern recognition is one of the most important tools to identify the process state in statistical process control. The abnormal process state could be classified by the recognition of unnatural patterns that arise from assignable causes. In this study, a wavelet based neural network approach is proposed for the recognition of control chart patterns that have various characteristics. The procedure of proposed control chart pattern recognizer comprises three stages. First, multi-resolution wavelet analysis is used to generate time-shape and time-frequency coefficients that have detail information about the patterns. Second, distance based features are extracted by a bi-directional Kohonen network to make reduced and robust information. Third, a back-propagation network classifier is trained by these features. The accuracy of the proposed method is shown by the performance evaluation with numerical results.

Keywords:
Pattern recognition (psychology) Computer science Artificial intelligence Wavelet Control chart Artificial neural network Chart Classifier (UML) Feature extraction Process (computing) Feature (linguistics) Self-organizing map Backpropagation Data mining Mathematics Statistics

Metrics

5
Cited By
0.62
FWCI (Field Weighted Citation Impact)
12
Refs
0.75
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Statistical Process Monitoring
Social Sciences →  Decision Sciences →  Statistics, Probability and Uncertainty
Fault Detection and Control Systems
Physical Sciences →  Engineering →  Control and Systems Engineering
Advanced Statistical Methods and Models
Physical Sciences →  Mathematics →  Statistics and Probability

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