Fault diagnosis in sequential circuits

doi:10.1016/0026-2714(77)90195-0

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JOURNAL ARTICLE

Fault diagnosis in sequential circuits

Year: 1977 Journal: Microelectronics Reliability Vol: 16 (5)Pages: 549-550 Publisher: Elsevier BV

DOI: 10.1016/0026-2714(77)90195-0

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Keywords:

Sequential logic Computer science Fault (geology) Automatic test pattern generation Combinational logic Algorithm Point (geometry) Electronic circuit Table (database) Logic optimization Logic gate Reliability engineering Mathematics Logic synthesis Data mining Engineering

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VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Engineering and Test Systems

Physical Sciences → Engineering → Control and Systems Engineering

Fault diagnosis in sequential circuits

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