JOURNAL ARTICLE

Fault diagnosis in sequential circuits

Year: 1977 Journal:   Microelectronics Reliability Vol: 16 (5)Pages: 549-550   Publisher: Elsevier BV
Keywords:
Sequential logic Computer science Fault (geology) Automatic test pattern generation Combinational logic Algorithm Point (geometry) Electronic circuit Table (database) Logic optimization Logic gate Reliability engineering Mathematics Logic synthesis Data mining Engineering

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Citation History

Topics

VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Engineering and Test Systems
Physical Sciences →  Engineering →  Control and Systems Engineering

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