BOOK-CHAPTER

Characterization of Ferroelectric Films by Spectroscopic Ellipsometry

Keywords:
Ferroelectricity Characterization (materials science) Ellipsometry Materials science Nanotechnology Optoelectronics Thin film Dielectric

Metrics

3
Cited By
1.49
FWCI (Field Weighted Citation Impact)
56
Refs
0.84
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Liquid Crystal Research Advancements
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics

Related Documents

JOURNAL ARTICLE

Spectroscopic ellipsometry studies of ferroelectric thin films

Susan Trolier‐McKinstry

Journal:   Ferroelectrics Year: 1994 Vol: 152 (1)Pages: 169-174
JOURNAL ARTICLE

Optical characterization of ferroelectric PZT thin films by variable angle spectroscopic ellipsometry

Md. Shafiqur RahmanCarlos D. GarcíaA. S. BhallaRuyan Guo

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 2014 Vol: 9200 Pages: 92000A-92000A
© 2026 ScienceGate Book Chapters — All rights reserved.