Characterization of Ferroelectric Films by Spectroscopic Ellipsometry

BOOK-CHAPTER

Year: 1994 Physics of thin films Pages: 249-278 Publisher: Elsevier BV

DOI: 10.1016/b978-0-12-533019-0.50010-7

Keywords:

Ferroelectricity Characterization (materials science) Ellipsometry Materials science Nanotechnology Optoelectronics Thin film Dielectric

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