Thickness Dependent Physical Properties of Thermally Evaporated Nanocrystalline CdSe Thin Films

Anuradha Purohit; Subhash Chander; S.P. Nehra; M.S. Dhaka

doi:10.1007/s40195-015-0326-5

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Thickness Dependent Physical Properties of Thermally Evaporated Nanocrystalline CdSe Thin Films

Anuradha Purohit Subhash Chander S.P. Nehra M.S. Dhaka

Year: 2015 Journal: Acta Metallurgica Sinica (English Letters) Vol: 28 (10)Pages: 1299-1304 Publisher: Springer Science+Business Media

DOI: 10.1007/s40195-015-0326-5

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Keywords:

Materials science Nanocrystalline material Crystallite Diffractometer Scanning electron microscope Thin film Annealing (glass) Grain size Cadmium selenide Band gap Composite material Lattice constant Analytical Chemistry (journal) Optics Diffraction Optoelectronics Nanotechnology Metallurgy

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Quantum Dots Synthesis And Properties

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Copper-based nanomaterials and applications

Physical Sciences → Materials Science → Materials Chemistry

Thickness Dependent Physical Properties of Thermally Evaporated Nanocrystalline CdSe Thin Films

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