Growth and properties of vacuum evaporated ZnSe thin films

Abstract

Thin films of ZnSe were obtained on glass substrates in the temperature range 200 °C - 350 °C employing a Vacuum Co-evaporation method under a pressure of 1×10 ⁶ -2×10 ⁶ torr. X-ray diffraction, SEM, AFM and Energy dispersive analysis of X-rays (EDAX) studies were performed to investigate the structural, morphological and compositional properties of the films. The optical properties of the films were also studied and some of the optical constants like refractive index, optical absorption coefficient (a) and optical bandgap (Eg) were determined using the transmission spectra.