Vidya Nand SinghG. PartheepanBrijesh KumarAnkur Khare
This paper presents a simple method for controlling crystalline quality and morphology of InN. A buffer layer of indium oxide is deposited in-situ on Si substrate before growing InN by atmospheric pressure-halide vapour phase epitaxy. Glancing angle X-ray diffraction and scanning electron microscopic studies have been carried out. Buffer layer of indium oxide helps in the growth of indium nitride nanopetals.
J. G. LozanoFrancisco M. MoralesR. Garcı́aD. GonzálezV. LebedevCh. Y. WangV. CimallaO. Ambacher
Luis C. Jimenez B.Henry A. Méndez P.Beynor Antonio Páez-SierraMaría E. Ramírez O.Hernán Rodríguez H.
Akihiro WakaharaTohru TsuchiyaAkira Yoshida
V. LebedevCh. Y. WangS. HauguthV. M. PolyakovFrank SchwierzV. CimallaThomas KupsFrancisco M. MoralesJ. G. LozanoD. GonzálezMarcel HimmerlichJ.A. SchaeferStefan KrischokO. Ambacher
Liangbiao WangYanxia PanQianli ShenJunhao ZhangKeyan BaoZhengsong LouDejian ZhaoQuanfa Zhou