JOURNAL ARTICLE

Twin Support Vector Machines for Pattern Classification

JayadevaReshma RastogiSuresh Chandra

Year: 2007 Journal:   IEEE Transactions on Pattern Analysis and Machine Intelligence Vol: 29 (5)Pages: 905-910   Publisher: IEEE Computer Society

Abstract

We propose Twin SVM, a binary SVM classifier that determines two nonparallel planes by solving two related SVM-type problems, each of which is smaller than in a conventional SVM. The Twin SVM formulation is in the spirit of proximal SVMs via generalized eigenvalues. On several benchmark data sets, Twin SVM is not only fast, but shows good generalization. Twin SVM is also useful for automatically discovering two-dimensional projections of the data.

Keywords:
Support vector machine Pattern recognition (psychology) Artificial intelligence Ranking SVM Structured support vector machine Computer science Generalization Eigenvalues and eigenvectors Binary number Binary classification Classifier (UML) Benchmark (surveying) Mathematics

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1737
Cited By
37.81
FWCI (Field Weighted Citation Impact)
23
Refs
1.00
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Face and Expression Recognition
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Neural Networks and Applications
Physical Sciences →  Computer Science →  Artificial Intelligence
Blind Source Separation Techniques
Physical Sciences →  Computer Science →  Signal Processing

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