JOURNAL ARTICLE

Discriminating Among the Log-Normal, Weibull, and Generalized Exponential Distributions

Arabin Kumar DeyDebasis Kundu

Year: 2009 Journal:   IEEE Transactions on Reliability Vol: 58 (3)Pages: 416-424   Publisher: Institute of Electrical and Electronics Engineers

Abstract

In this paper we consider the model selection / discrimination among the three important lifetime distributions. All these three distributions have been used quite e®ectively to analyze lifetime data in the reliability analysis. We study the probability of correct selection using the maximized likelihood method, as it has been used in the literature. We further compute the asymptotic probability of correct selection and compare the theoretical and simulation results for di®erent sample sizes and for di®erent model parameters. The results have been extended for Type-I censored data also. The theoretical and simulation results match quite well. Two real data sets have been analyzed for illustrative purposes. We also suggest a method to determine the minimum sample size required to discriminate among the three distributions for a given probability of correct selection and a user speci¯ed protection level.

Keywords:
Weibull distribution Statistics Selection (genetic algorithm) Sample size determination Model selection Mathematics Probability distribution Exponential distribution Exponential function Sample (material) Computer science Exponential family Applied mathematics Artificial intelligence

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1.88
FWCI (Field Weighted Citation Impact)
34
Refs
0.88
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Citation History

Topics

Statistical Distribution Estimation and Applications
Physical Sciences →  Mathematics →  Statistics and Probability
Statistical Methods and Inference
Physical Sciences →  Mathematics →  Statistics and Probability
Statistical Methods and Bayesian Inference
Physical Sciences →  Mathematics →  Statistics and Probability

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