JOURNAL ARTICLE

Scanning Kelvin Probe Investigations of TiO2Nanoparticles/Poly(3-hexylthiophene) Hybrid Blends

Yogita BatraDeepa RaiB. R. Mehta

Year: 2013 Journal:   Applied Physics Express Vol: 6 (4)Pages: 041602-041602   Publisher: Institute of Physics

Abstract

This work presents a scanning Kelvin probe microscopy (SKPM) study of poly(3-hexylthiophene) (P3HT):TiO2 nanoparticle hybrid layers under dark and light conditions. This method gives information on the topography and local work function at the nanometer scale. TiO2 nanoparticles prepared by the chemical method are dispersed in P3HT organic matrix in the form of agglomerates as revealed by topography and field emission scanning electron microscopy (FESEM) images. Upon illumination, the SKPM image shows an excess of photogenerated electrons present in the polymer phase. A correlation between morphology and surface photovoltage is presented.

Keywords:
Kelvin probe force microscope Work function Materials science Nanoparticle Scanning electron microscope Nanometre Surface photovoltage Polymer Agglomerate Volta potential Phase (matter) Nanotechnology Optoelectronics Chemical engineering Chemistry Atomic force microscopy Spectroscopy Composite material Physics

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6
Cited By
0.21
FWCI (Field Weighted Citation Impact)
18
Refs
0.64
Citation Normalized Percentile
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Citation History

Topics

Organic Electronics and Photovoltaics
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Molecular Junctions and Nanostructures
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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