JOURNAL ARTICLE

Design of Dependent-Failure-Tolerant Microcomputer System Using Triple-Modular Redundancy

Michitaka KameyamaTakahiro Higuchi

Year: 1980 Journal:   IEEE Journal of Solid-State Circuits Vol: 15 (1)Pages: 138-142   Publisher: Institute of Electrical and Electronics Engineers

Abstract

Microcomputer system reliability using triple-modular redundancy (TMR) is discussed when failures exist not only in any single module but also in any two or three modules at a time. The optimal time interval is calculated by which the system will even be resynchronized periodically so that additional transient failures can be tolerated. It is shown that in spite of the optimal reaynchronisation, the reliability of the system cannot be improved by the ordinary TMR under some dependent-failures. For the purpose of eliminating the effect of dependent-failures, a new fault-tolerant microcomputer system is proposed where a program is executed three times by three CPU's.

Keywords:
Triple modular redundancy Redundancy (engineering) Microcomputer Fault tolerance Modular design Computer science Reliability engineering Reliability (semiconductor) Transient (computer programming) Embedded system Engineering Operating system

Metrics

1
Cited By
0.00
FWCI (Field Weighted Citation Impact)
8
Refs
0.33
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Data Processing Techniques
Physical Sciences →  Engineering →  Control and Systems Engineering
Cybersecurity and Information Systems
Physical Sciences →  Computer Science →  Computer Networks and Communications

Related Documents

JOURNAL ARTICLE

Design of Dependent-Failure-Tolerant Microcomputer System Using Triple-Modular Redundancy

KameyamaHiguchi

Journal:   IEEE Transactions on Computers Year: 1980 Vol: C-29 (2)Pages: 202-206
JOURNAL ARTICLE

Microcomputer reliability improvement using triple-modular redundancy

John F. Wakerly

Journal:   Proceedings of the IEEE Year: 1976 Vol: 64 (6)Pages: 889-895
JOURNAL ARTICLE

Microcomputer reliability improvement using triple-modular redundancy

Journal:   Microelectronics Reliability Year: 1976 Vol: 15 (5)Pages: 375-375
JOURNAL ARTICLE

Fault-tolerant digital systems development using triple modular redundancy

R. ŞincaCs. Szász

Journal:   International Review of Applied Sciences and Engineering Year: 2017 Vol: 8 (1)Pages: 3-7
© 2026 ScienceGate Book Chapters — All rights reserved.