JOURNAL ARTICLE
A millimeter wave active load-pull measurement system
Abstract
A millimeter wave active load-pull measurement system for large signal characterization of millimeter wave transistors is presented. The characterization system uses two six-port junctions for simultaneous impedance and power flow measurements. The advantages of the proposed measurement system are summarized. Large signal characterization of a GaAs FET at 28 GHz in terms of constant absorbed power contours, constant operating gain contours, and constant DC drain current contours in the complex Gamma /sub L/ plane are presented.< >
Keywords:
Extremely high frequency SIGNAL (programming language) Characterization (materials science) Millimeter Electrical impedance Port (circuit theory) Electrical engineering Power (physics) Active load Constant (computer programming) System of measurement Transistor Electronic engineering Computer science Physics Engineering Optics Telecommunications Voltage
Metrics
2
Cited By
0.63
FWCI (Field Weighted Citation Impact)
6
Refs
0.74
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Microwave and Dielectric Measurement Techniques
Physical Sciences → Engineering → Electrical and Electronic Engineering
Radio Frequency Integrated Circuit Design
Physical Sciences → Engineering → Electrical and Electronic Engineering
Microwave Engineering and Waveguides
Physical Sciences → Engineering → Electrical and Electronic Engineering
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