JOURNAL ARTICLE

Experimental study of the local magnetization reversal in exchange-biased spin-valve sensors

H. BoeveJ. De BoeckG. Borghs

Year: 2000 Journal:   IEEE Transactions on Magnetics Vol: 36 (5)Pages: 3059-3061   Publisher: IEEE Magnetics Society

Abstract

During the write action in magnetoresistive random access memories, the bit status is set by applying current pulses through on-chip word lines. The magnetic fields generated in this way are sufficient for switching the bit status. In this paper, an experimental study of the switching process in small spin-valves is initiated by assessing the effect of magnetic fields, generated by the on-chip word lines, on the nucleation of magnetic domains. The transport properties of micron-scale exchange-biased spin-valve sensors were used to detect the influence of these local magnetic fields.

Keywords:
Spin valve Magnetoresistance Condensed matter physics Magnetization Spin (aerodynamics) Magnetic field Materials science Nucleation Magnetoresistive random-access memory Nuclear magnetic resonance Computer science Physics Random access memory

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Topics

Magnetic properties of thin films
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Memory and Neural Computing
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Theoretical and Computational Physics
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics

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