Dislocation and Strain Distributions in CdTe/GaAs (001) Epilayers

Ruth Isabel Port; K. Durose; B. K. Tanner; Janet E. Hails; J.S. Gough; M.G. Astles; M.C. Carmo; M.J. Soares

doi:10.4028/www.scientific.net/msf.182-184.151

ScienceGate Book Chapters

JOURNAL ARTICLE

Dislocation and Strain Distributions in CdTe/GaAs (001) Epilayers

Ruth Isabel Port K. Durose B. K. Tanner Janet E. Hails J.S. Gough M.G. Astles M.C. Carmo M.J. Soares

Year: 1995 Journal: Materials science forum Vol: 182-184 Pages: 151-154 Publisher: Trans Tech Publications

DOI: 10.4028/www.scientific.net/msf.182-184.151

Get Full-Text PDF Get Analytical Report

Keywords:

Materials science Dislocation Cadmium telluride photovoltaics Strain (injury) Condensed matter physics Crystallography Optoelectronics Composite material Physics

Metrics

Cited By

0.44

FWCI (Field Weighted Citation Impact)

Refs

0.70

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Topics

Advanced Semiconductor Detectors and Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor Quantum Structures and Devices

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Dislocation and Strain Distributions in CdTe/GaAs (001) Epilayers

Metrics

Topics

Related Documents

Structure of (111) CdTe epilayers on misoriented (001) GaAs

Direct Observation of Dislocation Core Structures in CdTe/GaAs(001)

Dislocation reduction in HgCdTe epilayers on GaAs by using CdTe/CdZnTe strained-layer superlattices in CdTe layers

Direct Sub-Lattice Imaging of Interface Dislocation Structures in CdTe/GaAs(001)

Mis structures on Hg1-xCdxTe/CdTe/GaAs epilayers