Fault diagnosis of analog circuits with model-based technique

Abstract

The paper presents an automatic measurement system for the fault diagnosis of electronic analog circuits. A model-based technique is implemented in order to obtain the fault diagnosis equations of the circuit under test in symbolic form with respect to the circuit elements. The main advantage of the proposed method is a reduction of the computational complexity and an increase in the computing speed with respect to other numerical techniques. In the approach, both the single fault and the double fault diagnosis are considered.