JOURNAL ARTICLE

High voltage 4H-SiC Schottky barrier diodes

R. RaghunathanD. AlokB. Jayant Baliga

Year: 1995 Journal:   IEEE Electron Device Letters Vol: 16 (6)Pages: 226-227   Publisher: Institute of Electrical and Electronics Engineers

Abstract

Characteristics of 4H-SiC Schottky barrier diodes with breakdown voltages up to 1000 V are reported for the first time. The diodes showed excellent forward I-V characteristics, with a forward voltage drop of 1.06 V at an on-state current density of 100 A/cm/sup 2/. The specific on-resistance for these diodes was found to be low (2/spl times/10/sup -3/ /spl Omega/-cm/sup 2/ at room temperature) and showed a T/sup 1.6/ variation with temperature. Titanium Schottky barrier height was determined to be 0.99 eV independent of the temperature. The breakdown voltage of the diodes was found to decrease with temperature.

Keywords:
Diode Schottky diode Schottky barrier Materials science Breakdown voltage Optoelectronics Metal–semiconductor junction Wide-bandgap semiconductor Voltage Silicon carbide Omega Analytical Chemistry (journal) Electrical engineering Chemistry Physics Composite material

Metrics

107
Cited By
9.24
FWCI (Field Weighted Citation Impact)
7
Refs
0.99
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Silicon Carbide Semiconductor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Electromagnetic Compatibility and Noise Suppression
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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