A novel very wideband 2‐port S‐parameter calibration technique

Abstract

Abstract In this article explicit formulas are presented permitting the de‐embedding of two‐port S‐parameter data in the case of the through‐reflect family of calibration techniques. The readily programmable algorithm developed is applied to a novel through‐attenuate‐reflect method (TAR) which, unlike the through‐reflect‐line method, has no inherent bandwidth limitation.