Measurement of Small Dielectric Losses in Material with a Large Dielectric Constant at Microwave Frequencies

G. Rupprecht; R. O. Bell

doi:10.1109/tmtt.1961.1125313

ScienceGate Book Chapters

JOURNAL ARTICLE

Measurement of Small Dielectric Losses in Material with a Large Dielectric Constant at Microwave Frequencies

G. Rupprecht R. O. Bell

Year: 1961 Journal: IEEE Transactions on Microwave Theory and Techniques Vol: 9 (3)Pages: 239-242 Publisher: IEEE Microwave Theory and Techniques Society

DOI: 10.1109/tmtt.1961.1125313

Get Full-Text PDF Get Analytical Report

Abstract

A method is described for measuring dielectric losses at microwave frequencies in materials with a large dielectric constant. By observing a dielectric resonance in a sufficiently large sample, the loss tangent of the material can be obtained. Results on SrTiO/sub 3/, single crystals at 20 kMc are presented.

Keywords:

Dielectric Microwave Materials science Dissipation factor Dielectric loss Dielectric heating Permittivity Resonance (particle physics) Optoelectronics Physics Telecommunications Atomic physics Engineering

Metrics

Cited By

1.16

FWCI (Field Weighted Citation Impact)

Refs

0.86

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Topics

Microwave Dielectric Ceramics Synthesis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Photonic Crystals and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Measurement of Small Dielectric Losses in Material with a Large Dielectric Constant at Microwave Frequencies

Abstract

Metrics

Topics

Related Documents

DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES

MEASUREMENT OF DIELECTRIC CONSTANT AND LOSS FACTOR OF THE DIELECTRIC MATERIAL AT MICROWAVE FREQUENCIES

On Measurement of Dielectric Constant at Microwave Frequencies

Measurement of small dielectric loss at microwave frequencies

Measurement of the complex dielectric constant of very-high-dielectric-constant materials at microwave frequencies