JOURNAL ARTICLE

Electronic speckle interferometry, phase-mapping, and nondestructive testing techniques applied to real-time, thermal loading

Jianmin WangIan Grant

Year: 1995 Journal:   Applied Optics Vol: 34 (19)Pages: 3620-3620   Publisher: Optica Publishing Group

Abstract

A digital phase-mapping method has been developed for application in real-time electronic speckle interferometry studies. Its principles and application to a continuously deforming object are described. An efficient digital image-processing algorithm has been developed that permits quantitative interpretation of the resulting phase maps.

Keywords:
Electronic speckle pattern interferometry Speckle imaging Speckle pattern Interferometry Optics Phase (matter) Nondestructive testing Image processing Speckle noise Digital image processing Computer science Metrology Computer vision Image (mathematics) Physics

Metrics

15
Cited By
1.88
FWCI (Field Weighted Citation Impact)
10
Refs
0.87
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Thermography and Photoacoustic Techniques
Physical Sciences →  Engineering →  Mechanics of Materials
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics

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