Transmission electron microscopy study of n= 1–5 Srn+1TinO3n+1 epitaxial thin films

Wei Tian; Xiaoqing Pan; J. H. Haeni; Darrell G. Schlom

doi:10.1557/jmr.2001.0276

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Transmission electron microscopy study of n= 1–5 Sr_n+1Ti_nO_3n+1 epitaxial thin films

Wei Tian Xiaoqing Pan J. H. Haeni Darrell G. Schlom

Year: 2001 Journal: Journal of materials research/Pratt's guide to venture capital sources Vol: 16 (7)Pages: 2013-2026 Publisher: Springer Nature

DOI: 10.1557/jmr.2001.0276

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Keywords:

High-resolution transmission electron microscopy Materials science Transmission electron microscopy Epitaxy Electron diffraction Crystallography Thin film Perovskite (structure) Microstructure Selected area diffraction Substrate (aquarium) Molecular beam epitaxy Diffraction Analytical Chemistry (journal) Nanotechnology Optics Chemistry Physics Composite material

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Magnetic and transport properties of perovskites and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Transmission electron microscopy study of n= 1–5 Sr_n+1Ti_nO_3n+1 epitaxial thin films

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