JOURNAL ARTICLE

<title>Experimental Image Alignment System</title>

Alan L. MoyerStephen T. KowelPhillip G. Kornreich

Year: 1980 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 0230 Pages: 114-119   Publisher: SPIE

Abstract

A microcomputer-based instrument forlimage alignment with respect to a reference image is described which uses the DEFT sensor (Direct Electronic Fourier Transform) for image sensing and preprocessing. The instrument alignment algorithm which uses the two-dimensional Fourier transform as input is also described. It generates signals used to steer the stage carrying the test image into the correct orientation. This algorithm has computational advantages over algorithms which use image intensity data as input and is suitable for a microcomputer-based instrument since the two-dimensional Fourier transform is provided by the DEFT sensor.

Keywords:
Microcomputer Computer science Preprocessor Fourier transform Artificial intelligence Computer vision Image (mathematics) Orientation (vector space) Computer graphics (images) Mathematics Telecommunications

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Topics

Inertial Sensor and Navigation
Physical Sciences →  Engineering →  Aerospace Engineering
Adaptive optics and wavefront sensing
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Infrared Target Detection Methodologies
Physical Sciences →  Engineering →  Aerospace Engineering

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