JOURNAL ARTICLE

Optically excited resonant beam pressure sensor

Deepak UttamchandaniK.E.B. ThorntonBrian Culshaw

Year: 1987 Journal:   Electronics Letters Vol: 23 (25)Pages: 1333-1334   Publisher: Institution of Engineering and Technology

Abstract

Micromechanical silicon beams fabricated by anisotropic etching techniques are coated with a thin layer of chromium. An intensity-modulated laser beam focused on the beam generates transverse vibrations which are detected interferometrically. In the letter we report how the vibration frequency changes with temperature and pressure applied to the beam.

Keywords:
Materials science Beam (structure) Optics Excited state Silicon Etching (microfabrication) Transverse plane Vibration Laser Optoelectronics Laser beams Chromium Intensity (physics) Beam diameter Laser Doppler vibrometer Layer (electronics) Physics Acoustics Atomic physics Composite material

Metrics

16
Cited By
1.81
FWCI (Field Weighted Citation Impact)
5
Refs
0.87
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Photonic and Optical Devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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