Open-ended metallized ceramic coaxial probe for high-temperature dielectric properties measurements

Abstract

A metallized ceramic coaxial probe has been developed for high temperature complex permittivity measurements. The probe is made of alumina and metallized with a 3.0-mil-thick layer of moly-manganese, and a 0.5-mil-thick protective coating of nickel plating. It is shown that based on carrying out the network analysis calibration procedure up to 1000/spl deg/C, and on actual dielectric properties measurements, the probe provides accurate dielectric measurements over a broad frequency range (500 MHz to 3 GHz) and for temperatures up to 1000/spl deg/C. An uncertainty analysis based on two different calibration techniques was also given to help quantify possible measurement errors.