JOURNAL ARTICLE
RETRACTED: Structural, morphological, optical and photoluminescence properties of HfO2 thin films
Chunyu MaWeijie Wangjinhu WangChun-Yu MIAOS.L. LiQ.Y. Zhang
Year: 2013 Journal: Thin Solid Films Vol: 545 Pages: 279-284 Publisher: Elsevier BV
Keywords:
Photoluminescence Materials science Thin film Optoelectronics Nanotechnology
Metrics
20
Cited By
2.69
FWCI (Field Weighted Citation Impact)
19
Refs
0.92
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Electronic and Structural Properties of Oxides
Physical Sciences → Materials Science → Materials Chemistry
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences → Engineering → Electrical and Electronic Engineering
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