Spectroscopic Ellipsometry Studies of Indium Phthalocyanine Films

Abstract

Spectroscopic ellipsometry measurements are employed to investigate vacuum sublimed indium phthalocyanine (InPc) thin films on single-crystal silicon by a new type of scanning photometric ellipsometer in which the analyser and polarizer rotate synchronously. The complex dielectric function and optical constants of the film are obtained in the wavelength range 550 to 800 nm. It is found that there is a comparatively large absorption region at 600 to 800 nm for vacuum sublimed InPc film and the exciton coupling greatly influences its absorption spectrum.