JOURNAL ARTICLE

Experimental study of aluminum-induced crystallization of amorphous silicon thin films

Guo-Jun QiSam ZhangT.T. TangJianfeng LiXiao Wei SunXiaofei Zeng

Year: 2005 Journal:   Surface and Coatings Technology Vol: 198 (1-3)Pages: 300-303   Publisher: Elsevier BV
Keywords:
Materials science Crystallization Silicon Polycrystalline silicon Amorphous silicon Aluminium Thin film Crystallinity Annealing (glass) Amorphous solid Wafer Chemical vapor deposition Nanocrystalline silicon Crystallite Composite material Metallurgy Crystalline silicon Chemical engineering Nanotechnology Thin-film transistor Crystallography

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0.97
FWCI (Field Weighted Citation Impact)
9
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0.79
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Citation History

Topics

Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
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