We have investigated InGaAs MOSFETs using a mixture of Ga/sub 2/O/sub 3/ and Gd/sub 2/O/sub 3/ as the gate dielectric evaporated from a high-purity single-crystal Gd/sub 3/Ga/sub 5/O/sub 12/ source. We report the first Ga/sub 2/O/sub 3/(Gd/sub 2/O/sub 3/) insulated gate n-channel enhancement-mode In/sub 0.53/Ga/sub 0.47/As MOSFETs on an InP semi-insulating substrate. A 0.75/spl times/50 /spl mu/m/sup 2/ gate device exhibits an extrinsic transconductance of 190 mS/mm which is an order of magnitude improvement over previously reported values. The current gain cut-off frequency and the maximum frequency of oscillation are 6.8 and 7.8 GHz, respectively.
F. RenJ. M. KuoM. HongW. S. HobsonJ. R. LothianJenshan LinH.S. TsaiJ. P. MannáertsJ. KwoS. N. G. ChuY.K. ChenA.Y. Cho
Y.C. WangM. HongJ. M. KuoJ. P. MannáertsH.S. TsaiJ. KwoJ. J. KrajewskiY.K. ChenA.Y. Cho
Man Hoi WongHisashi MurakamiYoshinao KumagaiMasataka Higashiwaki
Yibo WangHehe GongXiaole JiaGenquan HanJiandong YeYan LiuHaodong HuXin OuXiaohua MaYue Hao