Porous Silicon Nanostructure Revealed By Electron Spin Resonance

Yao Xiao; T. J. McMahon; J. I. Pánkové; Y. S. Tsuo

doi:10.1557/proc-298-277

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Porous Silicon Nanostructure Revealed By Electron Spin Resonance

Yao Xiao T. J. McMahon J. I. Pánkové Y. S. Tsuo

Year: 1993 Journal: MRS Proceedings Vol: 298 Publisher: Cambridge University Press

DOI: 10.1557/proc-298-277

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Keywords:

Electron paramagnetic resonance Dangling bond Nanostructure Materials science Hyperfine structure Scanning electron microscope Porous silicon Silicon Electron Nanoscopic scale Condensed matter physics Nuclear magnetic resonance Molecular physics Crystallography Nanotechnology Atomic physics Chemistry Optoelectronics Physics Composite material

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Topics

Silicon Nanostructures and Photoluminescence

Physical Sciences → Materials Science → Materials Chemistry

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Ga2O3 and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Porous Silicon Nanostructure Revealed By Electron Spin Resonance

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