Hard-X-ray dark-field imaging using a grating interferometer

Franz Pfeiffer; Martin Bech; Oliver Bunk; Philipp Kraft; Eric F. Eikenberry; Ch. Brönnimann; C. Grünzweig; Christophe David

doi:10.1038/nmat2096

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Hard-X-ray dark-field imaging using a grating interferometer

Franz Pfeiffer Martin Bech Oliver Bunk Philipp Kraft Eric F. Eikenberry Ch. Brönnimann C. Grünzweig Christophe David

Year: 2008 Journal: Nature Materials Vol: 7 (2)Pages: 134-137 Publisher: Nature Portfolio

DOI: 10.1038/nmat2096

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Keywords:

Optics X-Ray Phase-Contrast Imaging Dark field microscopy Phase-contrast imaging Materials science Grating Scattering Contrast (vision) Synchrotron Medical imaging Physics Computer science Artificial intelligence Phase contrast microscopy Microscopy

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Advanced X-ray Imaging Techniques

Physical Sciences → Physics and Astronomy → Radiation

X-ray Spectroscopy and Fluorescence Analysis

Physical Sciences → Physics and Astronomy → Radiation

Crystallography and Radiation Phenomena

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Hard-X-ray dark-field imaging using a grating interferometer

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