XPS study on band alignment at PtO‐terminated ZnO(0001) interface

Abstract

Abstract The band alignment at the interface between Pt and O‐terminated ZnO(000 1 ) was investigated by depositing Pt films on ZnO using X‐ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle‐resolved X‐ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(000 1 ) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(000 1 ). The work function of ZnO(000 1 ) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(000 1 ) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(000 1 ) was 0.72 eV in this experiment. Copyright © 2010 John Wiley & Sons, Ltd.