The Locating Reflectometer

P.I. Somlo

doi:10.1109/tmtt.1972.1127692

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The Locating Reflectometer

P.I. Somlo

Year: 1972 Journal: IEEE Transactions on Microwave Theory and Techniques Vol: 20 (2)Pages: 105-112 Publisher: IEEE Microwave Theory and Techniques Society

DOI: 10.1109/tmtt.1972.1127692

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Abstract

A microwave measuring instrument which is capable of producing a visual or graphical record of the reflection coefficient /spl Gamma/ along the length of a waveguide component is described. The principle of operation is the evaluation, in real time by an analog method, of the Fourier transform of /spl Gamma/ as a function of frequency, resulting in /spl Gamma/ as a function of distance.

Keywords:

Fourier transform Optics Reflection (computer programming) Reflection coefficient Function (biology) Microwave Waveguide Component (thermodynamics) Computer science Acoustics Electronic engineering Physics Mathematics Engineering Mathematical analysis Telecommunications

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Advanced MEMS and NEMS Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Photonic and Optical Devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor Lasers and Optical Devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

The Locating Reflectometer

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