JOURNAL ARTICLE

Linear Regression for Face Recognition

Imran NaseemRoberto TogneriMohammed Bennamoun

Year: 2010 Journal:   IEEE Transactions on Pattern Analysis and Machine Intelligence Vol: 32 (11)Pages: 2106-2112   Publisher: IEEE Computer Society

Abstract

In this paper, we present a novel approach of face identification by formulating the pattern recognition problem in terms of linear regression. Using a fundamental concept that patterns from a single-object class lie on a linear subspace, we develop a linear model representing a probe image as a linear combination of class-specific galleries. The inverse problem is solved using the least-squares method and the decision is ruled in favor of the class with the minimum reconstruction error. The proposed Linear Regression Classification (LRC) algorithm falls in the category of nearest subspace classification. The algorithm is extensively evaluated on several standard databases under a number of exemplary evaluation protocols reported in the face recognition literature. A comparative study with state-of-the-art algorithms clearly reflects the efficacy of the proposed approach. For the problem of contiguous occlusion, we propose a Modular LRC approach, introducing a novel Distance-based Evidence Fusion (DEF) algorithm. The proposed methodology achieves the best results ever reported for the challenging problem of scarf occlusion.

Keywords:
Artificial intelligence Subspace topology Pattern recognition (psychology) Facial recognition system Computer science Face (sociological concept) Mathematics

Metrics

1013
Cited By
45.46
FWCI (Field Weighted Citation Impact)
40
Refs
1.00
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Face and Expression Recognition
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Face recognition and analysis
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Biometric Identification and Security
Physical Sciences →  Computer Science →  Signal Processing

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