JOURNAL ARTICLE

<title>Assembly, alignment, and testing of a GHIS brassboard instrument</title>

Alan B. PlautDanette P. Ryan-HowardAlexander C. ParkerDavid Weitz

Year: 1996 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 2812 Pages: 462-471   Publisher: SPIE

Abstract

The GHIS FTIR spectrometer is designed to be a plug-in replacement for the low-resolution filter wheel spectrometer employed in current GOES sounders. State-of-the-art retrieval algorithms will be able to produce atmospheric temperature and humidity profiles with improved vertical resolution and smaller uncertainties as a results of the instrument's higher spectral resolution. MIT Lincoln Laboratory has designed, assembled, and performed visible- wavelength tests of a GHIS brassboard spectrometer. Details of the assembly procedure will be presented, showing how the optical components were individually tested, then pre- aligned and integrated into the instrument at room temperature for eventual operation at a nominal 220K.

Keywords:
Spectrometer Spectral resolution Resolution (logic) Fourier transform infrared spectroscopy Imaging spectrometer Computer science Remote sensing Optics Engineering Physics Spectral line Artificial intelligence

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Topics

Calibration and Measurement Techniques
Physical Sciences →  Engineering →  Aerospace Engineering

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