JOURNAL ARTICLE

4489397 Chain configurable polycellular wafer scale integrated circuit

KinH Lee

Year: 1985 Journal:   Microelectronics Reliability Vol: 25 (3)Pages: 605-605   Publisher: Elsevier BV
Keywords:
Wafer Wafer-scale integration Scale (ratio) Chain (unit) Computer science Integrated circuit Embedded system Electronic engineering Electrical engineering Engineering Physics

Metrics

0
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.31
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Advanced Materials and Mechanics
Physical Sciences →  Engineering →  Mechanical Engineering

Related Documents

JOURNAL ARTICLE

4517659 Constant-distance structure polycellular very large scale integrated circuit

JohnT Chamberlain

Journal:   Microelectronics Reliability Year: 1986 Vol: 26 (2)Pages: 402-403
JOURNAL ARTICLE

4467400 Wafer scale integrated circuit

H. Stopper

Journal:   Microelectronics Reliability Year: 1985 Vol: 25 (2)Pages: 403-403
JOURNAL ARTICLE

4471483 Branched labyrinth wafer-scale integrated circuit

JohnT Chamberlain

Journal:   Microelectronics Reliability Year: 1985 Vol: 25 (2)Pages: 404-404
JOURNAL ARTICLE

4956602 Wafer scale testing of redundant integrated circuit dies

WilliamJ Parrish

Journal:   Microelectronics Reliability Year: 1991 Vol: 31 (5)Pages: 1057-1058
© 2026 ScienceGate Book Chapters — All rights reserved.