Polycrystalline thick Mg-Mn ferrite and ferrochromite films were deposited on polycrystalline ceramic substrates and on platinum by using chemical transport in close-spaced configuration. The deposition process was mostly diffusion controlled. Epitaxial growth of ferrite on platinum and sapphire crystals was observed. Films in the 100 to 1000-μm thickness range were continuous only in the case of relatively small substrate-ferrite thermal expansion mismatch. Suitable substrate materials were forsterite and platinum. Ferrite grain size increased with film thickness. Thick deposits were coarse-grained and had rough surfaces requiring grinding. Magnetic and electric film properties at X band, including reciprocal phase shift, were similar to those of bulk materials, with differences resulting from coarse-grain structure and from substrate effect. Promise for an X -band microstrip phase shifter appeared.
D. H. HarrisR. J. JanowieckiCharles E. SemlerM. C. WillsonJingzhen Cheng
Isabelle ZaquineH. BenaziziJ.C. Mage
S. CapraroJ. P. ChatelonM. Le BerreHélène JoistenT. RouillerBernard BayardD. BarbierJean Jacques Rousseau
Q. X. JiaAlp T. FindikoğluP. N. ArendtS. R. FoltynJ. M. RoperJ. R. GrovesJ. Y. CoulterY. Q. LiGerald F. Dionne