Electroless deposition of CoO thin films

Abstract

The influence of various preparation conditions such as bath composition, film growth and heat treatment conditions on the properties of chemical bath deposited cobalt II oxide thin films has been studied. The interference fringes on the transmission spectra were used to calculate the refractive index and the average thickness of the films. The effects of surface roughness of the films on the interference extrema are also analysed. The maximum film thickness obtainable in a single deposition cycle is about 700 nm. X-ray diffractometry, energy-dispersive analysis of x-ray fluorescence and electrical resistivity measurements were also used for the characterization of the films. The properties of the deposited films are similar to those of hot-sprayed and sol-gel and baked films but film deposition is simpler and more cost effective than via solution growth procedures.