JOURNAL ARTICLE

<title>Polarization models for Monte Carlo ray tracing</title>

Edward R. FreniereG. Groot GregoryRichard A. Hassler

Year: 1999 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 3780 Pages: 148-150   Publisher: SPIE

Abstract

In many optical systems, the polarization state of light is of critical importance and must be considered during their design. In other systems, the polarization state is used and manipulated as an integral part of the design. Three methods exist for modeling the polarization state of light: the Mueller calculus; the Jones calculus; and the polarization ray tracing calculus. The relative advances of these methods for simulating the polarization behavior of real devices using Monte Carlo ray tracing software is discussed, including simulation of the polarization properties of scattered light.

Keywords:
Monte Carlo method Polarization (electrochemistry) Ray tracing (physics) Tracing Computer science Distributed ray tracing Software Optics Statistical physics Physics Mathematics Chemistry

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7
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FWCI (Field Weighted Citation Impact)
2
Refs
0.18
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Optical Polarization and Ellipsometry
Physical Sciences →  Engineering →  Biomedical Engineering
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics
Advanced optical system design
Physical Sciences →  Engineering →  Biomedical Engineering

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