JOURNAL ARTICLE

SWIR HgCdTe HDVIP detectors MTF Monte Carlo modeling and data

Arvind I. D'SouzaM. G. StapelbroekC. YoneyamaP. ElyM. R. SkokanH. D. Shih

Year: 2010 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 7660 Pages: 76600Q-76600Q   Publisher: SPIE

Abstract

The photocurrent of High Density Vertically Integrated Photodiodes (HDVIP) manufactured in LPE grown SWIR (λc ~ 2.5 μm) HgCdTe material is modeled as a function of incident spot location using a Monte Carlo diffusion calculation in the p-type bulk. The Monte Carlo calculation assumes a 3 x 3 mini-array of detectors surrounded by guard detectors. Carriers generated in the n-regions are always collected. The result is a responsivity map that yields the individual detector "spot scan" profile that is then used to calculate the detector modulation transfer function (MTF). Fourier transforms of detector "spot scan" response profile provided experimental confirmation of MTF that corresponded to the Monte Carlo modeled MTF.

Keywords:
Monte Carlo method Detector Optics Computer science Remote sensing Physics Geology Statistics

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Topics

Advanced Semiconductor Detectors and Materials
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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