Combined photoelectron and X-ray diffraction from ultrathin Fe films on Cu3Au(001)

F. Bruno; D. Cvetko; Luca Floreano; R. Gotter; C. Mannori; L. Mattera; R. Moroni; S Prandi; S. Terreni; Alberto Verdini; M. Canepa

doi:10.1016/s0169-4332(00)00213-0

JOURNAL ARTICLE

Combined photoelectron and X-ray diffraction from ultrathin Fe films on Cu3Au(001)

F. Bruno D. Cvetko Luca Floreano R. Gotter C. Mannori L. Mattera R. Moroni S Prandi S. Terreni Alberto Verdini M. Canepa

Year: 2000 Journal: Applied Surface Science Vol: 162-163 Pages: 340-345 Publisher: Elsevier BV

DOI: 10.1016/s0169-4332(00)00213-0

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Keywords:

Diffraction Materials science Specular reflection X-ray crystallography Epitaxy Synchrotron Beamline Monolayer Scattering Crystallography Substrate (aquarium) X-ray Alloy Layer (electronics) Analytical Chemistry (journal) Optics Chemistry Metallurgy Nanotechnology Physics Geology

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Magnetic properties of thin films

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Combined photoelectron and X-ray diffraction from ultrathin Fe films on Cu3Au(001)

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