Dependent binary relevance models for multi-label classification

Elena Montañés; Robin Senge; José Barranquero Tolosa; José Ramón Quevedo; Juan José del Coz; Eyke Hüllermeier

doi:10.1016/j.patcog.2013.09.029

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Dependent binary relevance models for multi-label classification

Elena Montañés Robin Senge José Barranquero Tolosa José Ramón Quevedo Juan José del Coz Eyke Hüllermeier

Year: 2013 Journal: Pattern Recognition Vol: 47 (3)Pages: 1494-1508 Publisher: Elsevier BV

DOI: 10.1016/j.patcog.2013.09.029

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Keywords:

Chaining Computer science Stacking Relevance (law) Benchmark (surveying) Binary number Dependency (UML) Artificial intelligence Machine learning Data mining Binary data Binary classification Support vector machine Mathematics

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Text and Document Classification Technologies

Physical Sciences → Computer Science → Artificial Intelligence

Web Data Mining and Analysis

Physical Sciences → Computer Science → Information Systems

Machine Learning and Data Classification

Physical Sciences → Computer Science → Artificial Intelligence

Dependent binary relevance models for multi-label classification

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