Transient electrical measurements of amorphous chalcogenide thin films

James E. Hall

doi:10.1016/0022-3093(70)90127-4

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Transient electrical measurements of amorphous chalcogenide thin films

James E. Hall

Year: 1970 Journal: Journal of Non-Crystalline Solids Vol: 2 Pages: 125-132 Publisher: Elsevier BV

DOI: 10.1016/0022-3093(70)90127-4

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Keywords:

Chalcogenide Amorphous solid Transient (computer programming) Trapping Materials science Exponential decay Voltage Time constant Analytical Chemistry (journal) Space charge Exponential function Current (fluid) Atomic physics Chemistry Optoelectronics Physics Thermodynamics Electrical engineering Electron Mathematics Crystallography

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Transient electrical measurements of amorphous chalcogenide thin films

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