JOURNAL ARTICLE

Optical Constants of Vacuum-Evaporated Silver Films*

R. HuebnerE. T. ArakawaR. A. MacRaeR. N. Hamm

Year: 1964 Journal:   Journal of the Optical Society of America Vol: 54 (12)Pages: 1434-1434   Publisher: Optica Publishing Group

Abstract

The optical constants of vacuum-evaporated silver films were determined in the wavelength region 2500–3700 Å from reflectance measurements made at various angles of incidence. These data were obtained to investigate the discrepancy between the experimental optical emission studies from electron-bombarded thin silver foils and transition radiation theory when the optical constants of bulk silver were used as input data. The discrepancy of about 30% in the photon intensity at the peak of emission is removed when the optical constants of evaporated films are used. These optical constants also predict accurately the resonance absorption found in the optical transmission of thin silver foils.

Keywords:
Materials science Vacuum evaporation Optics Wavelength Absorption (acoustics) Thin film Radiation Angle of incidence (optics) Optical radiation Analytical Chemistry (journal) Optoelectronics Chemistry Physics Nanotechnology

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10
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0.98
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Citation History

Topics

Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Laser-induced spectroscopy and plasma
Physical Sciences →  Engineering →  Mechanics of Materials
Ion-surface interactions and analysis
Physical Sciences →  Engineering →  Computational Mechanics

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