JOURNAL ARTICLE

Inelastic Electron Tunneling Spectroscopy of an Alkanethiol Self-Assembled Monolayer Using Scanning Tunneling Microscopy

Norio OkabayashiYouhei KondaTadahiro Komeda

Year: 2008 Journal:   Physical Review Letters Vol: 100 (21)Pages: 217801-217801   Publisher: American Physical Society

Abstract

We report inelastic electron tunneling spectroscopy (IETS) of a C8 alkanethiol self-assembled monolayer using a scanning tunneling microscope (STM). High-resolution STM IETS spectra show clear features of the C-H bending and C-C stretching modes in addition to the C-H stretching mode, which enables a precise comparison with previously reported vibrational spectroscopy, especially electron energy loss spectroscopy data. Intensity variation of vibrational peaks with tip position is discussed with the STM IETS detection mechanism.

Keywords:
Inelastic electron tunneling spectroscopy Scanning tunneling microscope Spectroscopy Scanning tunneling spectroscopy Materials science Monolayer Quantum tunnelling Spin polarized scanning tunneling microscopy Electron energy loss spectroscopy Molecular vibration Electron spectroscopy Self-assembled monolayer Electrochemical scanning tunneling microscope Atomic physics Molecular physics Chemistry Nanotechnology Optics Physics Optoelectronics Raman spectroscopy Transmission electron microscopy

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