Structural and electrical properties of 0.1BiYbO3–0.9PbTiO3 piezoelectric thin films grown by pulsed laser deposition

Yajian Li; Peng Shi; Xiaoqing Wu; Wei Ren

doi:10.1016/j.ceramint.2015.03.198

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Structural and electrical properties of 0.1BiYbO3–0.9PbTiO3 piezoelectric thin films grown by pulsed laser deposition

Yajian Li Peng Shi Xiaoqing Wu Wei Ren

Year: 2015 Journal: Ceramics International Vol: 41 Pages: S202-S205 Publisher: Elsevier BV

DOI: 10.1016/j.ceramint.2015.03.198

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Keywords:

Materials science Piezoelectricity Pulsed laser deposition Curie temperature Thin film Dielectric Annealing (glass) Diffraction Deposition (geology) Analytical Chemistry (journal) Nanotechnology Composite material Optoelectronics Optics Condensed matter physics

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Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Acoustic Wave Resonator Technologies

Physical Sciences → Engineering → Biomedical Engineering

Multiferroics and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Structural and electrical properties of 0.1BiYbO3–0.9PbTiO3 piezoelectric thin films grown by pulsed laser deposition

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