Radiation damage measurements on the SVX readout chip

N. Bacchetta; R. Ely; C. Haber; S. Kleinfelder; O. Schneider; W. C. Wester

doi:10.1016/0168-9002(93)90990-y

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Radiation damage measurements on the SVX readout chip

N. Bacchetta R. Ely C. Haber S. Kleinfelder O. Schneider W. C. Wester

Year: 1993 Journal: Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Vol: 324 (1-2)Pages: 284-287 Publisher: Elsevier BV

DOI: 10.1016/0168-9002(93)90990-y

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Keywords:

Discriminator Transconductance Amplifier Chip CMOS Physics Transistor Detector Optoelectronics Noise (video) Radiation Electrical engineering Computer science Optics Engineering Voltage

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Topics

Particle Detector Development and Performance

Physical Sciences → Physics and Astronomy → Nuclear and High Energy Physics

Radiation Effects in Electronics

Physical Sciences → Engineering → Electrical and Electronic Engineering

Radiation Detection and Scintillator Technologies

Physical Sciences → Physics and Astronomy → Radiation

Radiation damage measurements on the SVX readout chip

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