Fault diagnosis of timed discrete event systems using Dioid Algebra

Sobhi Baniardalani; Javad Askari

doi:10.1007/s12555-012-0366-9

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Fault diagnosis of timed discrete event systems using Dioid Algebra

Sobhi Baniardalani Javad Askari

Year: 2013 Journal: International Journal of Control Automation and Systems Vol: 11 (6)Pages: 1095-1105 Publisher: Springer Science+Business Media

DOI: 10.1007/s12555-012-0366-9

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Keywords:

Concurrency Automaton Computer science Nondeterministic algorithm Algebra over a field Process calculus Reachability Observer (physics) Algorithm Mathematics Theoretical computer science Pure mathematics Distributed computing Physics

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Petri Nets in System Modeling

Physical Sciences → Computer Science → Computational Theory and Mathematics

Formal Methods in Verification

Physical Sciences → Computer Science → Computational Theory and Mathematics

Fault Detection and Control Systems

Physical Sciences → Engineering → Control and Systems Engineering

Fault diagnosis of timed discrete event systems using Dioid Algebra

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