The microstructure of porous alumina and porous silicon nitride is analyzed by STEM and EDS techniques, and compared to microstructures of respective dense materials. No appreciable segregation of inherent impurities towards boundaries was observed in porous alumina. As for silicon nitride, EDS elemental maps show the presence of the amorphous phase elements along the pores surface and an unusually thick intergranular amorphous layer.
Yuichi IkuharaHidehiro YoshidaTaketo Sakuma