Characterization of PZT thin films prepared by a modified sol–gel method

B. Matthes; G. Tomandl; Günter Werner

doi:10.1016/s0955-2219(98)00442-7

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Characterization of PZT thin films prepared by a modified sol–gel method

B. Matthes G. Tomandl Günter Werner

Year: 1999 Journal: Journal of the European Ceramic Society Vol: 19 (6-7)Pages: 1387-1389 Publisher: Elsevier BV

DOI: 10.1016/s0955-2219(98)00442-7

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Keywords:

Materials science Lead zirconate titanate Slurry Sol-gel Dispersion (optics) Characterization (materials science) Composite material Thin film Zirconate Dispersant Molar ratio Acetic acid Chemical engineering Deposition (geology) Titanate Ferroelectricity Dielectric Ceramic Nanotechnology Organic chemistry Optics Catalysis

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Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Electrophoretic Deposition in Materials Science

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave Dielectric Ceramics Synthesis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Characterization of PZT thin films prepared by a modified sol–gel method

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