Tracer-diffusion of 44Ti in TiAl single crystal

Tetsushi Ikeda; Hideki Kadowaki; Hideo Nakajima; H. Inui; M. Yamaguchi; M. Koiwa

doi:10.1016/s0921-5093(00)01871-2

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Tracer-diffusion of 44Ti in TiAl single crystal

Tetsushi Ikeda Hideki Kadowaki Hideo Nakajima H. Inui M. Yamaguchi M. Koiwa

Year: 2001 Journal: Materials Science and Engineering A Vol: 312 (1-2)Pages: 155-159 Publisher: Elsevier BV

DOI: 10.1016/s0921-5093(00)01871-2

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Keywords:

TRACER Perpendicular Thermal diffusivity Anisotropy Diffusion Crystal (programming language) Single crystal Materials science Vacancy defect Analytical Chemistry (journal) Chemistry Crystallography Physics Optics Nuclear physics Geometry Thermodynamics

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Intermetallics and Advanced Alloy Properties

Physical Sciences → Engineering → Mechanical Engineering

Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Nuclear Materials and Properties

Physical Sciences → Materials Science → Materials Chemistry

Tracer-diffusion of 44Ti in TiAl single crystal

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