Christopher T. NelsonPeng GaoJacob R. JokisaariColin HeikesCarolina AdamoAlexander MelvilleSeung‐Hyub BaekChad M. FolkmanBenjamin WinchesterYijia GuYuanming LiuKui ZhangEnge WangJiangyu LiLong‐Qing ChenChang‐Beom EomDarrell G. SchlomXiaoqing Pan
The role of defects and interfaces on switching in ferroelectric materials is observed with high-resolution microscopy.
Vishal BodduFlorian EndresPaul Steinmann
Chao WangJun JiangXiaojie ChaiJianwei LianXiaobing HuAnquan Jiang
Xin LiLinming ZhouCheng LiYongjun WuYu HuangZijian Hong
Yoshihiro IshibashiYutaka Takagi